SEM is a tool for studying the topographic features of fractures or other surfaces. SEM produces detailed surface pictures that provide important topographical information at magnification up to 200,000.

The EDS (X-Ray Microanalysis) technique provides compositional analysis of areas chosen in the SEM image. Our EDS is sensitive to all elements heavier than Boron (Atomic Number 5).

We are available to discuss your needs and recommend a specific approach to your particular problem. For quotations or preliminary consultations, call or write. We can offer rapid turnaround and cost-effective results.